Joel 2000-FXII TEM
Joel 2000 FXII TEM
Jeol 2000FXII Transmission Electron Microscope
Jeol 2000FXII (Jeol Ltd., Tokyo, Japan) is available for Transmission Electron Microscopy.
The Jeol 2000FXII Transmission Electron Microscope has the capability of running at voltages up to 200kV and produces good resolution digital images. This is a high resolution instrument for TEM imaging, Scanning Transmission Electron Microscopy (STEM) and electron diffraction.
Transmission Electron Microscopy is a microscopy technique whereby a beam of electrons is transmitted through an ultrathin specimen, interacting with the specimen as it passes through it. An image is formed from the electrons transmitted through the specimen, magnified and focused by an objective lens. The image appears on a fluorescent imaging screen, plus a monitor, and can be recorded by a CCD camera.
The TEM is used in both materials science/metallurgy and the biological sciences. In both cases the specimens must be very thin and able to withstand the high vacuum present inside the instrument.