The EM Facility houses a Scanning Electron Microscope (JEOL 5510) and a Transmission Electron Microscope (JEOL 2000FXII). The Jeol 5510 SEM is equipped with an Energy Dispersive X-ray Microanalysis Detector (Oxford Instruments). Both microscopes are capable of digital imaging.
Services provided by the EM Facility staff can be tailored to the needs of the investigator. The examination of a broad range of specimens from cultured cells to polymers, and from nanoparticles to botanical samples can be carried out in the EM Facility.Electron Microscopy; Training and Support