Joel JSM 5510 SEM
Jeol Scanning Electron Microscope JSM-5510 (Jeol Ltd., Tokyo, Japan) is available forScanning Electron Microscopy.
The Jeol Scanning Electron Microscope (JSM 5510) operates at voltages up to 30kV, and has an Oxford Instruments Energy Dispersive X-Ray Spectroscopy detector attachment for elemental analysis.
The scanning electron microscope (SEM) images the sample surface by scanning it with a high-energy beam of electrons in a raster scan pattern. The beam of electrons strikes the surface of the specimen and interacts with the sample at or near its surface, producing signals that contain information about the sample. The types of signals generated by an SEM include secondary electrons, back scattered electrons, characteristic x-rays and light. Electronic devices are used to detect and amplify the secondary electrons and display them as an image which is digitally captured and displayed on a computer monitor. The SEM can produce very high-resolution images of a sample surface, revealing details less than 5 nm in size. SEM micrographs have a very large depth of focus yielding a characteristic three-dimensional appearance useful for understanding the surface structure of a sample.
The SEM in the EM Facility is currently used to study samples from a variety of projects, from many different disciplines, including materials science, food science, biological sciences and geology. In all cases specimens must be dry, conductive and able to withstand the high vacuum present inside the instrument.